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Blog
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Knowledge Center
White Paper
Using In-Chip Monitoring and Deep Data Analytics for High Bandwidth Memory (HBM) Reliability and Safety
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White Paper
Predictive and Prescriptive Maintenance in the Context of Automotive Functional Safety
DOWNLOAD
White Paper
On-Chip Monitoring and Deep Data Analytics System
DOWNLOAD
Webinar
Addressing Silent Data Errors for Resilient Data Centers
WATCH
Webinar
How Deep Data Analytics Accelerates SoC Time-to-Market by 6 Months
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Case Study
proteanTecs and Dell Technologies - Ensuring Reliability and Safety of Electronics
read
Webinar
The Data Revolution of Semiconductor Production - How Advancements in Technology Unlock New Insights
watch
White Paper
Maintaining Vehicles of the Future: Unleashing Deep Data to Fuel Predictive and Preventive Maintenance
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Webinar
The Era of Chiplets and Heterogeneous Integration: Challenges and Emerging Solutions to Support 2.5D and 3D Advanced Packaging
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White Paper
GUC GLink™ Test Chip Uses In-Chip Monitoring and Deep Data Analytics for High Bandwidth Die-to-Die Characterization
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White Paper
Semico Research: Deep Data Analytics Accelerating SoC Product Development
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White Paper
Elevating production testing with deep data analytics and ACS at the edge and cloud
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Webinar
The Changing Landscape of Automotive Electronics
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Case Study
Xsight Labs Uses Deep Data Monitoring by proteanTecs to Advance Predictive Maintenance in Data Centers
Read
Webinar
Zero Trust Supply Chains and the Risk of Gray Market Chips
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White Paper
Supply Chain Security and Counterfeit Detection Using Universal Chip Telemetry
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Webinar
Electronics Health and Performance Monitoring from Production to the Field with Deep Data Analytics
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Webinar
Discussing Datacenter Uptime and Cloud Service Availability with Amazon, Siemens and Synopsys
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Webinar
From timing-margins to cache-misses in advanced SoCs – with Siemens
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White Paper
Multi-Layer Deep Data Performance Monitoring and Optimization - with Siemens
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Webinar
Improving Quality and Time-to-Revenue with Universal Chip Telemetry™ (UCT)
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Webinar
Discussing Reliability in Automotive Electronics with NXP, Renesas Electronics and Qualcomm
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Webinar
From Structural & Functional Testing to Deep Data Parametric Testing
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Webinar
Discussing Datacenter Uptime via Hardware Reliability with Marvell and Dell EMC
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Webinar
Deep Data Quality and Reliability Monitoring of Heterogeneous Packaging
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Publication
In-field, In-mission Reliability Monitoring Based on Deep Data
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Webinar
2.5D Package Reliability: A Global Unichip (GUC) HBM Use Case
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White Paper
Reliability Monitoring of GUC High Bandwidth Memory (HBM) Subsystem
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Webinar
The Future of Reliability Testing with Dr. Joe McPherson
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Publication
Degradation Monitoring - From Vision to Reality
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Bite-Size Insights
Introducing proteanTalk – Our New Series of Educational Videos
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