System Production
Optimize system production at scale with deep-data insights that improve quality and performance, from pilot builds to full-scale production.
BRIDGING THE GAP BETWEEN SILICON AND SYSTEMSystem Production
System Production
Applications
Predictive insight for system production. Powered by telemetry, not guesswork.
- Core System NPI
- Bring-up with deep visibility, faster debug, and earlier readiness for volume production
- System Advanced Ops
- Improved quality, yield, and efficiency in mass production with population-level insights
- Anomaly Detection
- Detection of hidden system-level defects in real time to prevent escapes before systems ship
- VDD Setting Optimization
- Optimized voltage setting tailored to real workloads and actual system operating conditions
- SystemLens
- Live monitoring and debugging on the system under test for real-time tuning, diagnostics and RMA analysis
OUR PARTNERS
Reduce Power with a Safety-Net
AVS Pro™ provides a real-time, deep data application that monitors power usage in mission-mode with a failure prevention layer, going far beyond conventional Adaptive Voltage Scaling (AVS) methods.
Extending Chip Lifetime
with Safer Voltage Scaling
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Fast decision making for voltage reduction
(AVS or Frequency increase (AFS)
A HW decision making approach, based on aggregated timing states from Margin Agents measurements
The decision is discrete: Two additional steps for Frequency or Voltage
AFS Brochure
Prediction-based VDDmin Optimization per Chip
Optimize Power per device during chip test
- Increase accuracy with per-chip prediction, as opposed to large chip bins
- Optimize power reduction and reduce
test time for VDDmin search - Operate at a lower voltage
while meeting performance specs - Automatic model training in platform
and porting to ATE edge library
System VDDmin
proteanTecs AVS Pro™ provides a real-time, deep data application that monitors power usage in mission-mode with a failure prevention layer, going far beyond conventional Adaptive Voltage Scaling (AVS) methods.
Binning in Action
proteanTecs AVS Pro™ provides a real-time, deep data application that monitors power usage in mission-mode with a failure prevention layer, going far beyond conventional Adaptive Voltage Scaling (AVS) methods.
Deep-Data Analytics Platform
Design-aware, guided analytics with a production cockpit and pre-built journeys.
- Data management and visualization
- Algorithm and ML-model libraries
- Insights and alerts
- Open integration
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Quantify functional test coverage with silicon-aware insight.
Timing-margin-based toggle activity reveals how effective each test really is, helping teams select the right tests, expose coverage gaps, and create higher-quality test sets.
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Debug power integrity where it actually matters - under real workloads.
Measure AC IR drop in-system to reveal how workloads impact power delivery, pinpoint bottlenecks, and optimize board-level power for max stability and performance.
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Precisely tune system performance by correlating real workloads with deep silicon-level telemetry.
Identify worst-case scenarios and quantify their true impact, to optimize performance settings in the system, without over-guardbanding.
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Continuously quantify reliability under real workloads.
Measure timing margin degradation over time to understand aging behavior, identify reliability risks early, and model long-term system performance.
WHITE PAPER
Optimizing System Production with On-Chip Telemetry and ML-Driven Analytics
Population-Level Visibility at Scale
Analyze system behavior across large production volumes to uncover trends, outliers, and systemic issues that are invisible at the single-unit level, improving overall quality and reliability.
Early Detection of Production Issues
Detect assembly, power delivery, thermal solution, and clock source issues during high-volume manufacturing, before they turn into escapes or costly RMAs.
Cross-Stage Correlation for Faster Root Cause Analysis
Correlate data across production stages to quickly trace issues back to their source, reducing investigation time and accelerating issue resolution.
TECHNOLOGY
See How It's Done
Expose Hidden Failures Before Systems Ship
Identify missed defects in real time, including thermal solution issues, assembly defects, power delivery and clock integrity problems, and timing margin anomalies, before they escape to the field.
Bridges Chip Test and System Reality
Leverage Agent measurements and ML models to dynamically refine the voltage settings established during chip production testing, and tailor them for real-world system workloads and system environment.
POWER & PERFORMANCE
Explore Our Full Suite of Power Reduction Solutions
All Your System Signals, on a Single Canvas
Live, high-resolution visibility into system behavior to enable faster debug, root-cause analysis, and RMA investigation directly on the system under test.
CONFIDENCE IN EVERY SYSTEM
Industries
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WHAT OUR CUSTOMERS ARE SAYING
"proteanTecs’ technology will accelerate our product development cycle and give us the confidence to scale quickly. Additionally, our customers will benefit from system in-field monitoring, as we are dealing with highly advanced electronics in uptime-sensitive markets."
June Paik • CEO, FuriosaAI
"The software within the vehicle must be maintained and updated with the highest performance and availability. proteanTecs’ technology essentially transforms chips into smart system sensors for the entire electronic control."
Michal Geva • VP and GM of OTA and Cybersecurity, HARMAN
common questions & answers
FAQ
Get answers to common questions about how proteanTecs bridges silicon and system behavior to deliver predictive insight, faster debug, and scalable quality across system production.
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With embedded Agents, chips become intelligent sensors within the system. They measure timing margins, power integrity, voltage behavior, thermal impact, and workload interaction from inside the silicon, providing insight that external test equipment cannot access.
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Traditional functional test provides pass/fail results. proteanTecs adds parametric telemetry visibility, revealing timing margins, power integrity behavior, workload impact, and system interactions, enabling predictive insights instead of binary results.
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Our analytics and in-test applications expose hidden system-level defects that traditional tests often miss, including thermal solution issues, assembly defects, power delivery problems, clock integrity issues, and timing margin anomalies before systems ship.
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During system bring-up, teams often struggle with limited visibility into how silicon behaves under real software workloads and real operating conditions. The solution provides deep, real-time telemetry from inside the chip to accelerate root-cause analysis, reduce debug cycles, and shorten the path to production readiness.
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Timing-Based Functional Test Coverage measures how effective functional tests really are by analyzing timing-margin-based activity. This helps teams identify coverage gaps, select better tests, and build higher-quality test sets.
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System Production is used across complex electronic systems such as automotive ECUs, data center servers, AI accelerators, networking switches, storage systems, communication infrastructure, and advanced compute boards.
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Yes. In automotive systems such as ECUs and ADAS platforms, deep telemetry helps detect assembly issues, power delivery weaknesses, thermal risks, and degradation early, supporting high reliability requirements and reducing field failures.
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Yes. Predictive test outcomes and anomaly detection expose hidden system-level defects in real time, which helps prevent escapes before shipment and reduces costly retests. The solution addresses PCB, module, and full system functional testing, enabling real‑time insight under actual workloads and configurations across NPI and high‑volume manufacturing.
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Yes. The solution is designed to integrate seamlessly into existing functional test and production environments. It works alongside standard manufacturing flows, accessing on-chip telemetry through supported interfaces without requiring disruptive changes to the production line. Analytics can be deployed in the cloud or integrated into existing data infrastructures to support scalable, high-volume manufacturing.