proteanTecs Solution - Chip Production

Chip Production

Continuously optimize SoC production with predictive analytics and adaptive insights, from product ramp through high-volume manufacturing.

30%: Time-to-market reduction

10x: DPPM reduction

50%: ‘No Problem Found’ reduction

Predictive analytics, from first silicon to mass production

Chip Production Applications

The crystal ball for your production. Powered by data, not magic.

Core Chip NPI: Smart characterization, debug and qualification for high-volume readiness at higher confidence

Chip Advanced Ops: Continuous production monitoring to optimize quality, yield and cost at scale

Outlier Detection: Per-die inline screening of small and latent defects without compromise to yield

VDDmin Prediction: Personalized static Vmin setting with optimized performance margins and test cost

Power & Performance Binning: Inline process grading for precise power and performance binning

One Platform, All Your Needs

Explore our silicon proven examples – just a few of many use cases.

Apples-to-apples correlation of post-silicon measurements back to pre-silicon models to quickly validate assumptions, resolve discrepancies, and accelerate bring-up.
Identify the optimal mix of dies, wafers, or lots by analyzing parametric signatures, device behavior, and variability to ensure the right material enters each stage.
Monitor in-situ performance drift and degradation during HTOL to uncover early reliability risks and validate long-term device behavior.

Compare key metrics across product generations or design variants to uncover trends, validate improvements, and drive faster learning cycles.
Quantify the coverage and effectiveness of functional tests using deep-data metrics to reveal blind spots and ensure robust validation.
Correlate data across multiple stages and test types to identify systemic issues, improve test efficiency, and accelerate root-cause analysis.

Advanced Ops

See Beyond the Limits of Test

Edge-to-cloud analytics for production insight at high-volume manufacturing test

SEE HOW IT WORKS

Deep-Data Analytics Platform

Design-aware, guided analytics with a production cockpit and pre-built journeys.

Data management and visualization
Algorithm and ML-model libraries
Insights and alerts
Open integration

Monitoring Quality, Cost and Parametric Yield

Die, wafer, and lot population analysis

Systematic parametric yield loss detection
Wafer-level and lot-level outlier detection
Stage-to-stage analysis
RMA investigations and resolution

ML-Driven Inline Analytics

In-test software applications run adaptive algorithms in near real-time.

Dynamic test and intelligent decision making
Personalized per-die/SoC assessment
On testers, ATEs, and probe stations
Based on Agent measurements

Outlier Detection

Find the Needle in the Haystack, at the Click of a Button.

Catch latent defects before they make it to the field, with ML-based and per-die detection of production anomalies at test.

Predictive ML estimators
From the first tested died
Reduce false positives and negatives
Agents measurements and test data
No compromise to yield
Beyond pass/fail

Towards Zero Defects

Reduce DPPM, prevent Silent Data Corruption and enhance Functional Safety with proteanTecs outlier detection techniques

IDDQ-Based Outlier Detection

Compare measured IDDQ against predicted values to confidently prevent quality escapes without compromising yield. Faulty dies are flagged as early as wafer sort, enabling proactive screening and smarter downstream decisions.

Margin-Based Outlier Detection

Identify outliers with marginal or latent defects through advanced margin quantification of millions of path delays, delivering rich parametric visibility. Gain early detection of suspect dies with increased visibility.

Quality Insights and Root Cause Analysis

Gain powerful analytics and insights on production quality with stage-to-stage correlation analysis that connects data across the entire test flow. Accelerate RMA investigations and resolution through deep visibility into root causes.

IDDQ-Based Outlier Detection

Compare measured IDDQ against predicted values to confidently prevent quality escapes without compromising yield. Faulty dies are flagged as early as wafer sort, enabling proactive screening and smarter downstream decisions.
Margin-Based Outlier Detection

Identify outliers with marginal or latent defects through advanced margin quantification of millions of path delays, delivering rich parametric visibility. Gain early detection of suspect dies with increased visibility.
Quality Insights and Root Cause Analysis

Gain powerful analytics and insights on production quality with stage-to-stage correlation analysis that connects data across the entire test flow. Accelerate RMA investigations and resolution through deep visibility into root causes.

VDDMin Prediction

Accurately Personalize Power Setting While Reducing Test Time

Leverage deep in-chip telemetry and machine learning to accurately predict VDDmin for static per-die VDD setting and tune operational settings at system test.

Personalized assessment
Lower max-power
Test time reduction
Cost reduction
Telemetry and ML-based
Inline decisions at test

VDDmin Prediction Inline decisions on the tester3

Predicts VDDmin using Profiling & Classification Agents, sensitive to process variance across all transistor types and standard cells.
A deep data machine learning solution allowing minimal steps for unmatched accuracy. Save time with only 1-2 search steps, instead of the conventional multi-step VDDmin shmoo.
ML models are training on characterization data collected – leveraging Agent fusion, statistical analysis and advanced algorithms. Once validated, the training models are deployed to the edge software on the tester.
Integrates seamlessly into the test program and provides assessment on the test floor for real-time decisions.
Reduce VDDmin guard band between ATE, SLT and System Test based on timing-margin measurement.

Gain visibility into operational and environmental conditions, real workloads vs. structural test, and effects of voltage regulator and power supply.

Power & Performance Binning

Maximize Yield and Revenue While Reducing Overdesign

Turn process variation into competitive advantage with intelligent, fine-grained power and performance binning based on true silicon characteristics.

Classify each chip with precision
Optimize power and performance per die
Enable smarter segmentation

Granular Binning by Process Grading

Per-die Power/Frequency binning, from day one
Process grading of each IC in the process distribution
As early as Wafer Sort
Edge application at ATE

WHAT OUR CUSTOMERS ARE SAYING

"proteanTecs’ technology will accelerate our product development cycle and give us the confidence to scale quickly. Additionally, our customers will benefit from system in-field monitoring, as we are dealing with highly advanced electronics in uptime-sensitive markets."

June Paik • CEO, FuriosaAI

Explore case study

"Our collaboration with proteanTecs offers us a differentiated edge and enables us to bring our customer’s complex solutions to market at higher performance, at a faster pace. Mutual customers gain on-chip monitoring through the entire product lifecycle, extending all the way from production into the field."

Mohit Gupta • SVP and GM, Custom Silicon and IP, Alphawave

"By partnering with proteanTecs, we can enable seamless integration of their on-chip monitoring agents with Neoverse CSS to further accelerate time to market"

Eddie Ramirez • VP of Go-to-Market, Infrastructure Line of Business, Arm

"proteanTecs' deep data insights will empower our mutual customers to optimize their designs, improve their power/performance envelope, proactively prevent faults, and deliver superior products faster."

Dr. Charlie Su • CTO and President, Andes Technology

"proteanTecs gives us remarkable visibility into what causes units to pass or fail, as well as ways to improve everything, including the silicon, the package, the tester, the hardware, and the test program itself"

Ran Schrift • Director of Operations, Xsight Labs

"With proteanTecs, we can further optimize the performance and power efficiency of our processors, while ensuring reliability at scale. Our customers also benefit from in-field system monitoring, as our highly advanced processors must reliably support large-scale AI tasks in data centers and in the cloud."

Sue Ryu • CEO, SAPEON

"proteanTecs on-chip monitoring analytics adds a deeper layer of insights into our robust testing and verification program"

Kalyan Mulam • SVP of ASIC Engineering, Astera Labs

"While every product development is unique, our analysis clearly shows how proteanTecs’ cross-functional approach is driving new value by empowering companies to understand issues and tackle new challenges."

Rich Wawryzniak • Principal Analyst, Semico

"By collaborating with proteanTecs, we are providing high-resolution insights on the SoC’s profile, health, and performance, enabling our mutual customers to achieve even greater benefits across the supply chain."

Andrzej Strojwas • CTO, PDF Solutions

common questions & answers

FAQ

Get answers to common questions about how proteanTecs improves quality, reduces power, and enhances performance, all while ensuring reliable, cost-efficient production.

The Chip Production Solution is a comprehensive suite of applications that leverage proteanTecs’ deep data analytics to optimize semiconductor manufacturing from ramp to high-volume production. It combines on-tester software and a cloud-based platform to deliver predictive insights for quality, power, yield, and performance optimization.
It addresses key challenges in semiconductor production such as outlier escapes, test inefficiency, yield loss, and variability across lots or sites. By detecting latent defects, predicting performance, and enabling adaptive process control, it helps manufacturers confidently improve product quality and throughput while reducing operational costs.
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proteanTecs’ agents embedded in the chip generate rich parametric data. This data is processed by on-tester software running ML-trained models and algorithms in near real time. The cloud platform then correlates insights across devices, lots, and stages, providing a closed-loop analytics system that continuously learns and adapts.
The solution provides APIs and data connectors for seamless integration with ATEs and analytics tools. On-tester software runs inline without disrupting test flow, and cloud analytics can be deployed in flexible architectures to align with customer IT and security policies.
proteanTecs employs enterprise-grade encryption, secure communication channels, and strict data governance policies. The platform can be deployed in private, hybrid, or public cloud environments, ensuring compliance with customer security standards.
The Chip Production Solution is designed for any organization designing or manufacturing advanced chips, including hyperscalers, fabless companies, IDMs, and OSATs. It supports products built on advanced digital process nodes (down to 2nm) and delivers value across a wide range of device architectures, production environments, and performance targets.
Yes, and much more. While it delivers the core benefits of SLM, such as deep visibility into chip DFT health, the Chip Production Solution extends far beyond traditional lifecycle management. It provides rich, correlated insights from production to in-field, in-mission operation, enables actionable intelligence at the edge, and system learnings to continuously learn and adapt. This creates a closed-loop mechanism that improves throughout the entire silicon lifecycle.
Yes. Machine learning models continuously retrain based on new production data, improving predictive accuracy and enabling ongoing process optimization across device generations and production sites.
Unlike conventional test data analysis that relies on end-of-line results, proteanTecs’ approach is device-centric and predictive, per design. By combining on-chip telemetry with advanced analytics, it delivers real-time insights and proactive control, transforming test from a validation step into a source of continuous intelligence.

Chip Production

Request Chip Production Demo

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Request Power & Performance Binning Demo

Enhance quality, yield, power & performance, and operational efficiency with deep data visibility.

Chip Production Applications

Core Chip NPI

Accelerate Volume Readiness with Confidence