Power is the New Performance:
Scaling The Next Generation of SoCs

Abstract

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What if you can save power and gain performance in your next chip?

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This 40-minute panel presents a novel method to reduce power and boost performance by leveraging on-chip monitoring data. From per-die operational voltage customization at test to in-field dynamic voltage scaling in mission-mode, you’ll learn how to move past ‘worst-case settings’ to real-world adaptability. 

Topics covered:

• How leading chipmakers are increasing performance-per-watt
• How reclaiming unused guard bands reduces power  
• How power reduction extends the device useful life
• Closed-loop hardware-firmware approach for real-time power reduction
• ML-driven personalization of power management for each chip

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This session features a demonstration that highlights how embedded agents monitor power usage in real-time with a failure prevention layer, going far beyond conventional Adaptive Voltage Scaling (AVS) methods. We’ll showcase real-world results from multiple customers achieving 8-14% power savings with silicon-proven technology.

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Meet Our Panelists
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Dr. Joe McPherson

CEO, McPherson Reliability Consulting

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Dr. J.W. McPherson is a renowned expert in the field of Reliability Physics and Engineering. He has published over 200 scientific papers, is the author of the Reliability Chapters for 4 books and has been awarded 30 patents. Dr. McPherson was formerly a Texas Instruments Senior Fellow and past General Chairman of the IEEE International Reliability Physics Symposium (IRPS) and still serves on its Board of Directors.
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Noam Brousard

Vice President, Solutions Engineering, proteanTecs

Noam Brousard joined proteanTecs in 2017 and is Vice President of Solutions Engineering. Noam has over 20 years of experience in system, hardware, and software product development and management in consumer, telecom, mobile, and IoT electronics systems markets. Before joining proteanTecs, Noam held VP R&D position at Vi, and senior technical positions at Intel Wireless Innovation Solutions, Orckit and ECI Telecom.
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Alex Burlak

Vice President Test and Analytics, proteanTecs

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Alex Burlak joined proteanTecs in 2018 and is Vice President of Advanced Analytics and Test. Alex has combined expertise in Production Testing and Data Analytics of ICs and system products. Before joining the company, Alex held Senior Director of Interconnect and Silicon Photonics Product Engineering positions at Mellanox.