ON-DEMAND WEBINAR
2.5D Packages: How to Monitor Today So They Don’t Fail Tomorrow
A GUC HBM2E 3.2Gbps PHY and CoWoS Use Case showcasing the use of proteanTecs’ deep data embedded monitoring to achieve improved reliability in a GUC 7nm HBM Controller
A GUC HBM2E 3.2Gbps PHY and CoWoS Use Case showcasing the use of proteanTecs’ deep data embedded monitoring to achieve improved reliability in a GUC 7nm HBM Controller
AI, HPC and Networking demands require integration of multiple chips including processors, networking, Serdes, and HBM memory devices to achieve their high performance, modularity and yield. TSMC's 2.5D CoWoS technology is best fitted for high scale assembly. Short distance and fine pitch connectivity enables power, area and beachfront efficient interface. Many dies can be assembled with minimal power and area interfacing overhead.
A GUC HBM2E 3.2Gbps PHY and CoWoS Use Case
As the complexity of 2.5D packaging continues to develop, reliability challenges arise. This is especially true in the interconnects between the SoC and HBM memories where high density prohibits duplicating connectivity. A new approach to reliability monitoring is emerging, for DPPM reduction and in-field failure prevention, based on Deep Data chip telemetry.
In this webinar, the use of proteanTecs’ deep data embedded monitoring for a High Bandwidth Memory (HBM) device to achieve reliability goals will be discussed and results from a GUC 7nm HBM Controller ASIC will be presented.
What you will learn:
About HBM I/O and CoWoS bump quality monitoring in GUC’s 7nm and 5nm HBM2E PHYs
How accuracy was validated in GUC’s 7nm and 5nm HBM2E testchips
How to monitor quality in the field during normal chip operation
How to prevent system operation failure and extend chip lifetime
How to identify marginal IOs and CoWoS bumps via advanced analytics, long before HBM interface failure occurs
How repair algorithms replace marginal IOs/ bumps with redundant ones at next boot cycle
Explore the fabless chipmaker's quality leap thanks to die-to-die interconnect failure prediction based on parametric lane grading
This 40-minute webinar offers 3 unique perspectives on this growing market and ecosystem from experts.
proteanTecs’ 100% coverage, parametric lane grading in-missןon mode, addresses one of the most significant challenges in heterogeneous integration testing: poor interconnect visibility.