ON-DEMAND WEBINAR
The Future of Reliability Testing
Renowned reliability expert, Dr. Joe McPherson, explains the physics and connection between chip power, performance and reliability.
Renowned reliability expert, Dr. Joe McPherson, explains the physics and connection between chip power, performance and reliability.
The semiconductor industry is ready for the next phase in its evolution, entering the era of data. To cope with the rising uncertainties associated with advanced electronics, the fragmented nature of the industry and the limited visibility in today’s best-known-methods, a paradigm shift is needed in the fundamental approach to how data is sourced, correlated and used.
This webinar will discuss Universal Chip Telemetry™ (UCT) for chip production, providing high coverage on-chip monitoring for parametric visibility in product bring up and volume testing.
In this webinar, you will learn:
This webinar highlights how embedded agents monitor power usage in real-time with a failure prevention layer; we’ll showcase real-world results .
Discover how the fabless chipmaker used proteanTecs on-tester and cloud analytics to prevent a flood of RMAs with ML-powered spatial analysis
Predict and prevent failures with proteanTecs real-time health monitoring