Are you seeking to achieve dramatic gains in product time to market?

This joint collaboration combines PDF Solutions’ semiconductor big data analytics solutions with proteanTecs’ deep data offering for chip and system lifecycle analytics to enable data-driven actionable insights for device centering, design margin assessment, yield limiter detection, test tool debug and excursions correction. The webinar highlights the benefits of an integrated end-to-end analytics solution to accelerate ​learning for NPI and early ramp​ including drill-down diagnostics from lots to device subsystems​. It also shows how to improve test understanding for device characterization.

What you will learn:

• Design validation visibility with Agents and analytics assessing chip health at every stage​
• Analytics tool from fab through device testing
• Design validation enabling data fusion for in-die visibility, analytics and machine learning
• Faster validation by accelerated use of data
• Actual use cases