Optimizing System Production with On-Chip Telemetry and ML-Driven Analytics

White Paper

Abstract

As system companies integrate increasingly advanced chips onto their boards for high-performance markets such as AI, Cloud, Telecommunications, and Automotive, the complexity of system production continues to rise. Ensuring quality, performance, and lifetime reliability while minimizing test costs and production time has become a significant challenge.

proteanTecs offers a revolutionary solution that addresses these challenges by combining embedded on-chip telemetry with an ML-driven analytics engine. This approach provides deep data sources and insights previously unavailable with traditional production methods. By transforming chips into intelligent system sensors, proteanTecs enables first-ever parametric visibility during functional test and real-time insights as software interacts with silicon.

This allows system vendors to detect hidden failures (e.g., power integrity, thermal, and assembly faults), make informed inline decisions, optimize performance, and improve power efficiency at scale and in real-time. Ultimately, proteanTecs bridges the longstanding gap between silicon and system behavior, empowering system vendors to reduce costs, improve efficiency, and accelerate the delivery of high-quality products to market.

You’ll Learn How To

  • Go beyond traditional test methods that miss subtle issues that impact reliability
  • Leverage on-chip telemetry for visibility into system performance under real-world conditions
  • Accelerate system bring-up and optimize power settings for maximum efficiency
  • Strategies for reducing debug time by up to 50% and improving test efficiency
  • Prevent costly RMAs through early anomaly detection
  • Transform testing from simple pass/fail to parametric insights

Thank You!

Click the button to watch the webinar.
Watch It
Oops! Something went wrong while submitting the form.