Live Webinar

2.5D Packages: How to Monitor Today So They Don’t Fail Tomorrow

A GUC HBM2E 3.2Gbps PHY and CoWoS Use Case
May 20 2020
12pm EST
40 Minutes
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Abstract

AI, HPC and Networking require integration of multiple dies (processors, networking, Serdeses, HBM memories) for high performance, modularity and yield. TSMC's 2.5D CoWoS technology is best fitted for high scale assembly. Short distance and fine pitch connectivity enable power, area and beachfront efficient interface. Many dies can be assembled with minimal power and area interfacing overhead.

As the complexity of 2.5D packaging continues to develop, reliability challenges arise. This is especially true in the interconnects between the SoC and HBM memories where high density prohibits duplicating connectivity. A new approach to reliability monitoring is emerging, for DPPM reduction and in-field failure prevention, based on Deep Data chip telemetry.

In this webinar, the operation concept of proteanTecs’ Proteus for High Bandwidth Memory (HBM) reliability will be discussed and results from a GUC 7nm HBM Controller ASIC will be presented.

You’ll Learn:

  • About HBM I/O and CoWoS bump quality monitoring in GUC’s 7nm and 5nm HBM2E PHYs
  • How accuracy was validated in GUC’s 7nm and 5nm HBM2E testchips
  • How to monitor quality in the field during normal chip operation
  • How to prevent system operation failure and extend chip lifetime
  • How to identify marginal IOs and CoWoS bumps via advanced analytics, long before HBM interface failure occurs
  • How repair algorithms replace marginal IOs/ bumps with redundant ones at next boot cycle

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You can now download the recorded webinar:

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You'll Learn:
About HBM I/O and CoWoS bump quality monitoring in GUC’s 7nm and 5nm HBM2E PHYs
How accuracy was validated in GUC’s 7nm and 5nm HBM2E testchips
How to monitor quality in the field during normal chip operation
How to prevent system operation failure and extend chip lifetime
How to identify marginal IOs and CoWoS bumps via advanced analytics, long before HBM interface failure occurs
How repair algorithms replace marginal IOs/ bumps with redundant ones at next boot cycle
Guest Speaker: Igor Elkanovich, Global Unichip (GUC) CTO

Spanning a career of over 30 years, Igor Elkanovich served in technical leadership positions for numerous Semiconductors companies (Broadcom, Infineon, Freescale and others). Today, Igor serves as the CTO of Global Unichip (GUC). He is responsible for driving IP and methodology development using TSMC’s advanced silicon process and packaging technology while supervising definition and execution of large scale projects. His main focus is in Networking, AI and HPC applications.

In-field HBM monitoring and repair, with results from a GUC 7nm HBM Controller ASIC.