Our series of educational videos
Visibility into the expected post-production variability of power and performance
Monitor health & performance of chips, from design to field
A new Deep Data measure for performance, quality, and reliability based on embedded Agents™
All materials tend to degrade, and will eventually fail, with time. Electronics are no exception.
Learn how performance degradation monitoring in production and in-field is used to prevent failures and allow predictive maintenance.
Classification of chips into "Families" - fine clusters with similar behavior across many dimensions, at any operating condition and across all test and operating stages.
A new approach to high coverage, high resolution outlier detection.
High resolution binning to maximize material utilization and optimize offering for different markets / SKUs.
Early detection of yield fluctuation for overall parametric yield improvement
A new way of achieving faster volume testing with shorter time in tester per chip.